On October 19th 2015, the Bureau of Standards, Metrology and Inspection (BSMI) has promulgated 4 national standards (CNS 15811-2, CNS 15811-3, CNS 15811-4 and CNS 15811-5) of measurement of electromagnetic immunity for integrated circuits.
Referring to the international standards of IEC 62132 series, CNS 15811 series, promulgated by BSMI, apply to measurement of electromagnetic immunity for integrated circuits for the frequency range from 150 kHz to 1 GHz.
The 4 newly promulgated national standards provide the immunity measurement methods, including TEM cell and wideband TEM cell method, Bulk current injection (BCI) method, Direct RF power injection method, and Workbench Faraday cage method.
In addition, these 4 national standards coordinating with CNS 15811-1, "Integrated circuits - Measurement of electromagnetic immunity - 150 kHz to 1 GHz - Part 1: General conditions and definitions", promulgated on May 20th 2015, have established the complete series of national standards for the measurement of electromagnetic immunity for integrated circuits to assist semiconductor companies in evaluating and improving electromagnetic immunity of integrated circuits at the early design phase, to avoid the undesired effects of integrated circuits that can not meet the specification in packaging or production phases, to reduce the development and production cost, and to ensure the user safety of end-products. Positive effects would be brought to the development of semiconductor industry in Taiwan.
Relevant information has been posted on CNS Online website at http://www.cnsonline.com.tw.
Department in charge: First Division of BSMI
Contact person: Mr. Yu-Hsun Huang
Telephone:(02)3343-2229